AMETEK Verifire 红外干涉仪，文章来源于AMETEK阿美特克，红外干涉仪是根据恒星干涉仪和射电干涉仪的原理而设计成应用于红外波段的仪器。适用于高精度红外成像应用的测量方法，Verifire 干涉仪，红外波长光学成像的应用广泛，种类繁多。在系统的设计波长下进行测试对开发、最终对准和鉴定至关重要。用于航空航天和国防的夜视、红外和热成像系统、光刻子系统、遥感望远镜和外来材料鉴定对波长有不同的要求，而它们都受益于在红外干涉仪系统在设计波长下的测试。由于干涉仪的分辨率取决于波长和望远镜（或射电天线）间的距离之比，而红外波长比射电波长小几个量级,所以在达到同样分辨率的要求下,红外干涉仪的基线距离比射电干涉仪缩短几个量级。在测量恒星的角径和分辨分立源时,基线距离为1公里的红外干涉仪（工作在10微米）,能达到基线相距为1万公里的甚长基线干涉仪（工作在10厘米）的效果。红外干涉仪除可提高分辨率外，还可用来获得极高分辨率的谱线轮廓。AMETEK Verifire Infrared Interferometers, Article from AMETEK AMETEK, Infrared interferometers are instruments designed to be applied in the infrared wavelength band based on the principles of stellar interferometers and radio interferometers. Measurements suitable for high-precision infrared imaging applications, Verifire interferometers, Infrared wavelength optical imaging is used in a wide variety of applications. Testing at the wavelength for which the system was designed is critical for development, final alignment and qualification. Night vision, infrared and thermal imaging systems, lithography subsystems, remote sensing telescopes, and exotic materials characterization for aerospace and defense have different wavelength requirements, and they all benefit from testing infrared interferometer systems at their design wavelengths. Since the resolution of an interferometer depends on the ratio of the wavelength to the distance between the telescope (or radio antenna), and since infrared wavelengths are several orders of magnitude smaller than radio wavelengths, the baseline distance of an infrared interferometer is several orders of magnitude shorter than a radio interferometer for the same resolution requirement. In the measurement of stellar angular diameter and resolution of discrete sources, the baseline distance of 1 kilometer of infrared interferometer (working at 10 microns), can reach the baseline distance of 10,000 kilometers of very long baseline interferometer (working at 10 centimeters) effect. In addition to improving resolution, infrared interferometers can be used to obtain very high-resolution spectral line profiles.